capabilities

JEOL JXA-8530F Hyperprobe

The JXA-8530F utilizes a field emission (FE) electron gun that makes it possible to perform elemental analyses of solid surfaces down to ultra-micro-areas (40 nm) at a probe current of only 10 nA. The JXA-8530F also offers an improved electron optical and evacuation systems to take advantage of the FE gun. These improvements, over conventional filament electron sources, generate a smaller probe diameter at lower accelerating voltages allowing the JXA-8530F to make quantitative analyses at much higher resolution than any other microprobe. The analytical and imaging specifications of the JXA-8500F are shown in the table below. Please contact us with any questions regarding sample analysis.

JEOL JXA-8530F Specifications

Specification	Range
Detectable Element Range	Be to U
Detectable Wavelength Range	0.087 to 11.4 nm
Number of X-ray spectrometers	1-5 (Plus EDS)
Specimen size	100 mm x 100 mm x 5 mm
X-Y range	90 mm x 90 mm
Accelerating Voltage	30 kV (0.1 kV steps)
Probe Current Range	10 pA - 500 nA
Min. Probe Size	400 nm@10 kV, 10 nA 100 nm@10 kV, 100 nA
Scanning Magnification	x40 - x300,000

JEOL JSM-6510 Low Vacuum SEM

The JSM-6510LV is a variable pressure Scanning Electron Microscope (SEM) that can handle samples up to 150 mm in diameter. This SEM can operate in a low vacuum mode to accomodate samples with a non-conductive surface and/or excessive water content. With a high resolution of 3.0nm at 30kV, the JSM-6510LV delivers amazing clarity of the finest structures. In addition to routine imaging at several hundreds of times greater resolution than the optical microscope, and with a focal depth several tens of times greater than the optical microscope, the SEM allows for detailed measurements, including 3D measurement from stereo images. Dual live image display of the secondary electron image and a backscattered composition image allow the user to contrast and compare specific details. The analytical and imaging specifications of the JSM-6510LV are shown in the table below. Please contact us with any questions regarding sample analysis.

JEOL JSM-6510LV Specifications

Specification	Range
Resolution	High Vacuum mode: 3.0 nm (30kV) Low Vacuum mode: 4.0 nm (30kV)
Accelerating voltage	0.5 to 30 kV
Magnification	x5 to 300,000 (printed as a 128mm x 96mm micrograph)
Filament	Pre-centered W hairpin filament (with continuous auto bias)
Objective lens	Super conical lens
Objective lens apertures	Three position, controllable in X/Y directions
Maximum specimen size:
LGS Type stage	125mm dia. full coverage (152.4mm dia. loadable)
Specimen stage:
LGS Type stage	Eucentric goniometer X=80mm, Y=40mm, Z=5mm-48mm R=360° (endless) Tilt -10/+90°

 

JEOL